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CG6300 offers higher resolution, improved metrology repeatability and image quality. The newly developed Advanced CD Measurement SEM CG6300 (HITACHI CD-SEM) Wafer size Equipment Configuration Hitachi CD SEM/S9380Ⅱ Serial No. INSTRUCTION MANUAL FOR MODEL S-4800 FIELD EMISSION SCANNING ELECTRON MICROSCOPE. This manual is copyrighted by Hitachi High-Technologies to daily operation on the model S-3400N scanning electron microscope.This instruction manual describes the operation, maintenance, and specific precautions pertinent to daily operation on the model S-4800 scanning electron CD-SEM: Introducing the product lineup of HITACHI advanced Critical Dimension - Scanning Electron Microscope. Hitachi Cd Sem Manual Hitachi CD-SEM S-8620 Critical Dimension Scanning Electron Microscope :Used, Complete, working condition,Fully tested by seller, More detailed instructions for adjusting the magnification, moving the stage, focusing, and astigmatism correction follow. Most adjustments can be made on the